Crystal Morphology Analysis of Piezoelectric Ceramics by Electron BackScatter Diffraction Method and Application to Multiscale Finite Element Analysis
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- UETSUJI Yasutomo
- Department of Mechanical Engineering, Osaka Institute of Technology
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- SATOU Yu
- Department of Mechanical Engineering, Osaka Institute of Technology
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- NAGAKURA Hideyuki
- 大阪工業大学大学院工学研究科機械工学専攻
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- NISHIOKA Hisanao
- 大阪工業大学大学院工学研究科経営工学専攻
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- KURAMAE Hiroyuki
- 大阪工業大学工学部技術マネジメント学科
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- TSUCHIYA Kazuyoshi
- 東海大学工学部精密工学科
Bibliographic Information
- Other Title
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- 電子線後方散乱法による圧電セラミックスの結晶形態分析とそれを用いたマルチスケール有限要素解析
- デンシセン コウホウ サンランホウ ニ ヨル アツデン セラミックス ノ ケッショウ ケイタイ ブンセキ ト ソレ オ モチイタ マルチスケール ユウゲン ヨウソ カイセキ
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Abstract
Micro crystal morphology, which affects strongly on macro electromechanical response of polycrystalline piezoelectric ceramics, was analyzed by electron backscatter diffraction method. We coated piezoelectric ceramics with amorphous osmium to defend against electrification caused by electron beam, and measured crystal orientations of 140×120μm2 over region with 0.32μm interval points. Then the obtained crystal orientations were applied to a multiscale finite element analysis to estimate the relation with macro homogenized properties. Especially, we investigated on finite element modeling conditions for crystal orientations, and presented a representative volume element of microstructure to compute macro and micro responses.
Journal
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- TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A
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TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A 74 (739), 342-347, 2008
The Japan Society of Mechanical Engineers
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Details 詳細情報について
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- CRID
- 1390001204479295104
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- NII Article ID
- 110006643456
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- NII Book ID
- AN0018742X
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- COI
- 1:CAS:528:DC%2BD1cXntValsbw%3D
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- ISSN
- 18848338
- 03875008
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- NDL BIB ID
- 9437857
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed