キャリア教育における教育効果の検討--キャリアに対する態度と自己の変化に注目して  [in Japanese] A study of educational effects of career education: investigations of learning evaluation and self-changes  [in Japanese]

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Author(s)

Abstract

The purpose of this study was to examine the educational effects of career education. The points of investigation were learning evaluation and attitude changes toward career and one's self. The group of students studied comprised 284 firstyear students. In the first class, they set their own study tasks to accomplish during the class based on the class's aims. Meanwhile, they also answered questions about their attitudes toward career and self. For each class, students evaluated their attitude and learning in the class. In the final class, they evaluated the overall learning process and answered questions on their attitudes toward career and self. The results showed a number of things. First, evaluations of their learning process were generally positive. Most students reported that they attended almost all classes, listened to lectures attentively, and active worked on exercises. Second, their attitude toward their career also positively changed. Some students worried about the vagueness of their career possibilities, but such anxiety did not harm their positive attitudes toward career development. Moreover, their sense of self changed positively. Especially, they developed some aspects that we explain as important aspects to be developed in the class. This result highlights the importance of becoming conscious of important points as tasks.

Journal

  • Kyoto University Researches in Higher Education

    Kyoto University Researches in Higher Education (14), 45-57, 2008

    Kyoto University

Codes

  • NII Article ID (NAID)
    110007003245
  • NII NACSIS-CAT ID (NCID)
    AN10487452
  • Text Lang
    JPN
  • Article Type
    departmental bulletin paper
  • Journal Type
    大学紀要
  • ISSN
    13414836
  • NDL Article ID
    10165422
  • NDL Source Classification
    ZF1(教育)
  • NDL Call No.
    Z7-B640
  • Data Source
    NDL  NII-ELS  IR 
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