TOF-SIMSの植物細胞壁化学への応用  [in Japanese] Application of TOF-SIMS in the chemistry of plant cell walls  [in Japanese]

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Author(s)

Abstract

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a surface-sensitive mass spectrometric technique with high mass resolution and provides chemical information about the surface of a solid sample without any chemical pretreatments. A significant advantage of TOF-SIMS over other techniques is its ability to obtain mass spectral imaging, which allows the direct location of the molecular or fragment ions of interest at a cellular level with submicrometer spatial resolution in biological samples. In this paper, we describe the current state of the art of TOF-SIMS in biological samples, and focus on the applications in chemistry of plant cell walls including lignin, heartwood extractives, and paper chemistry.

Journal

  • Regulation of Plant Growth & Development

    Regulation of Plant Growth & Development 43(2), 156-163, 2008

    The Japanese Society for Chemical Regulation of Plants

References:  42

Codes

  • NII Article ID (NAID)
    110007007939
  • NII NACSIS-CAT ID (NCID)
    AA11550064
  • Text Lang
    JPN
  • Article Type
    NOT
  • ISSN
    1346-5406
  • NDL Article ID
    9756835
  • NDL Source Classification
    ZR3(科学技術--生物学--植物)
  • NDL Call No.
    Z18-67
  • Data Source
    CJP  NDL  NII-ELS  J-STAGE 
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