書誌事項
- タイトル別名
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- 2002 Measurement of elastic constants of ultrathin Cu films by laser acoustic-phonon resonance spectroscopy
抄録
We developed the laser acoustic-phonon resonance spectroscopy for measuring the elastic modulus of ultrathin films. This method determines the out-of-plane elastic modulus by measuring the resonance frequency of acoustic phonons in thin films using the ultrashort-pulse laser, which allow us to determine the elastic modulus of thin films thinner than 100nm. In this study, we applied this method to Cu thin film deposited on Si substrates, and we found that epitaxially grown Cu thin films showed extremely stable elasticity: the out-of-plane elastic constant C_<33> was independent of the film thickness in the thickness range of 19-100nm and it was hardly affected by the annealing, despite the observation that the Cu thin film was highly strained due to the lattice mismatch with the substrate.
収録刊行物
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- 年次大会講演論文集
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年次大会講演論文集 2007.1 (0), 55-56, 2007
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390282681041636224
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- NII論文ID
- 110007086168
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- ISSN
- 24331325
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可