Soft X-ray Core-Level Photoemission Study of Boron Sites in Heavily Boron-Doped Diamond Films

• Okazaki Hiroyuki

  The Graduate School of Natural Science and Technology, Okayama University

• Yoshida Rikiya

  The Graduate School of Natural Science and Technology, Okayama University

• Muro Takayuki

  Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8

• Wakita Takanori

  Research Laboratory for Surface Science, Okayama University

• Hirai Masaaki

  Research Laboratory for Surface Science, Okayama University

• Muraoka Yuji

  Research Laboratory for Surface Science, Okayama University JST, CREST

• Takano Yoshihiko

  National Institute for Materials Science

• Iriyama Shingo

  School of Science and Engineering, Waseda University

• Kawarada Hiroshi

  School of Science and Engineering, Waseda University

• Oguchi Tamio

  Department of Quantum Matter, Graduate school of Advanced Sciences of Matter, Hiroshima University

• Yokoya Takayoshi

  Research Laboratory for Surface Science, Okayama University JST, CREST

Abstract

We have performed high-resolution soft x-ray B 1s core-level photoemission spectroscopy of heavily boron-doped diamond films in order to study the chemical sites of doped-boron atoms and their relation to the superconducting transition temperature (T_c). We find that B 1s core-level spectra exhibit several fine structures and three bulk components can be resolved from photon energy dependent studies and spectral fittings. These results indicate existence of several chemical environments of doped-boron atoms. One of the bulk components having the lowest binding energy can be assigned to a signal from substitutionally doped-boron atoms. Comparisons of bulk components with T_c suggest spectroscopic evidence for the importance of substitutionally doped-boron atoms for effective carrier and superconductivity.

Journal

• Journal of the Physical Society of Japan

  Journal of the Physical Society of Japan 78 (3), 034703-034703, 2009

  THE PHYSICAL SOCIETY OF JAPAN

Keywords

• superconducting materials
• photoemission spectroscopy
• core-level

Details

• CRID: 1390282679173210624
• NII Article ID: 130005437311
• NII Article ID: 110007138874
• NII Article ID: 210000107712
• NII Book ID: AA00704814
• DOI: 10.1143/jpsj.78.034703
• ISSN: 13474073
• ISSN: 00319015
• NDL BIB ID: 10183097
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I10183097
• Web Site: https://journals.jps.jp/doi/pdf/10.1143/JPSJ.78.034703
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed