20aRG-4 Surface Analysis of Fullerene-nanowhiskers by AFM

• HAMAda M.

  Dept. of Materials Chem., Hosei University

• Motohashi S.

  Dept. of Materials Chem., Hosei University

• Ogata H.

  Dept. of Materials Chem., Hosei University

Bibliographic Information

Other Title

• 20aRG-4 フラーレンナノウィスカーの表面状態のAFMによる評価(フラーレン,領域7,分子性固体・有機導体)

Journal

• Meeting Abstracts of the Physical Society of Japan

  Meeting Abstracts of the Physical Society of Japan 62.1.4 (0), 842-, 2007

  The Physical Society of Japan

Details

• CRID: 1390282680986936192
• NII Article ID: 110007191542
• DOI: 10.11316/jpsgaiyo.62.1.4.0_842_4
• ISSN: 21890803
• Text Lang: ja
• Data Source:
  • JaLC
  • CiNii Articles