Scattered-Field Time Domain Boundary Element Method and Its Application to Transient Electromagnetic Field Simulation in Particle Accelerator Physics

Access this Article

Search this Article

Author(s)

    • FUJITA Kazuhiro
    • the Division of Quantum Science and Engineering, Graduate School of Engineering, Hokkaido University
    • KAWAGUCHI Hideki
    • the Department of Electrical and Electronic Engineering, Muroran Institute of Technology
    • NISHIYAMA Shusuke
    • the Division of Quantum Science and Engineering, Graduate School of Engineering, Hokkaido University
    • TOMIOKA Satoshi
    • the Division of Quantum Science and Engineering, Graduate School of Engineering, Hokkaido University
    • ENOTO Takeaki
    • the Division of Quantum Science and Engineering, Graduate School of Engineering, Hokkaido University

Abstract

Authors have been working in particle accelerator wake field analysis by using the Time Domain Boundary Element Method (TDBEM). A stable TDBEM scheme was presented and good agreements with conventional wake field analysis of the FDTD method were obtained. On the other hand, the TDBEM scheme still contains difficulty of initial value setting on interior region problems for infinitely long accelerator beam pipe. To avoid this initial value setting, we adopted a numerical model of beam pipes with finite length and wall thickness on open scattering problems. But the use of such finite beam pipe models causes another problem of unwanted scattering fields at the beam pipe edge, and leads to the involvement of interior resonant solutions. This paper presents a modified TDBEM scheme, Scattered-field Time Domain Boundary Element Method (S-TDBEM) to treat the infinitely long beam pipe on interior region problems. It is shown that the S-TDBEM is able to avoid the excitation of the edge scattering fields and the involvement of numerical instabilities caused by interior resonance, which occur in the conventional TDBEM.

Journal

  • IEICE Trans. Electron., C

    IEICE Trans. Electron., C 90(2), 265-274, 2007-02-01

    The Institute of Electronics, Information and Communication Engineers

References:  26

Cited by:  4

Codes

  • NII Article ID (NAID)
    110007519609
  • NII NACSIS-CAT ID (NCID)
    AA10826283
  • Text Lang
    ENG
  • Article Type
    Journal Article
  • ISSN
    09168524
  • Data Source
    CJP  CJPref  NII-ELS 
Page Top