On Finding Don't Cares in Test Sequences for Sequential Circuits

• HIGAMI Yoshinobu

  Department of Computer Science, Ehime University

• KAJIHARA Seiji

  Department of Computer Sciences and Electronics, Kyushu Institute of Technology

• POMERANZ Irith

  School of Electrical and Computer Engineering, Purdue University

• KOBAYASHI Shin-ya

  Department of Computer Science, Ehime University

• TAKAMATSU Yuzo

  Department of Computer Science, Ehime University

Abstract

Recently there are various requirements for LSI testing, such as test compaction, test compression, low power dissipation or increase of defect coverage. If test sequences contain lots of don't cares (Xs), then their flexibility can be used to meet the above requirements. In this paper, we propose methods for finding as many Xs as possible in test sequences for sequential circuits. Given a fully specified test sequence generated by a sequential ATPG, the proposed methods produce a test sequence containing Xs without losing stuck-at fault coverage of the original test sequence. The methods apply an approach based on fault simulation, and they introduce some heuristics for reducing the simulation effort. Experimental results for ISCAS'89 benchmark circuits show the effectiveness of the proposed methods.

Journal

• IEICE Trans. Inf. & Syst., D

  IEICE Trans. Inf. & Syst., D 89 (11), 2748-2755, 2006-11-01

  The Institute of Electronics, Information and Communication Engineers

Keywords

• test generation
• don't care value
• sequential circuit
• stuck-at fault

Details

• CRID: 1571135652567545344
• NII Article ID: 110007538482
• NII Book ID: AA10826272
• ISSN: 09168532
• Text Lang: en
• Data Source:
  • CiNii Articles
  • KAKEN