Examinee Identification in e-Test using Press Localized Arc Pattern Method

• KIKUCHI Shinichi

  Graduate School of Engineering, Tokyo University of Science

• FURUTA Takehiro

  Faculty of Engineering, Tokyo University of Science

• AKAKURA Takako

  Faculty of Engineering, Tokyo University of Science

Bibliographic Information

Other Title

• e-Testにおける受験者認証のための筆圧局所円弧パターン法の提案
• e Test ニ オケル ジュケンシャ ニンショウ ノ タメ ノ ヒツアツ キョクショ エンコ パターンホウ ノ テイアン

Abstract

In this paper, we study an identification method to confirm examinees periodically during e-tests. First, we apply the localized arc pattern method, conventionally used for off-line identification based on the arc of an individual stroke of a certain sentence on paper, for examinee identification using pen tablets. Second, we propose a pressure localized arc pattern method that utilizes writing pressure which can be obtained on pen tablet, and evaluate the effectiveness of this method. Finally, we conduct e-tests to evaluate the pressure localized arc pattern method. Results of the e-tests suggest that pressure localized arc patterns can be used in examinee identification.

Journal

• Japan Journal of Educational Technology

  Japan Journal of Educational Technology 33 (4), 383-392, 2010

  Japan Society for Educational Technology

Keywords

• E-TEST
• EXAMIEE IDENTIFICATION
• BIOMETRICS

Details

• CRID: 1390282680204201600
• NII Article ID: 110007539010
• NII Book ID: AA11964147
• DOI: 10.15077/jjet.kj00006063551
• ISSN: 21896453
• ISSN: 13498290
• NDL BIB ID: 10589023
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I10589023
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed