20pHT-10 ゲルマニウム中の酸素不純物の赤外分光法による評価(20pHT 格子欠陥,ナノ構造(半導体),領域10(誘電体,格子欠陥,X線・粒子線,フォノン))  [in Japanese] 20pHT-10 Oxygen impurities in Ge crystals  [in Japanese]

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  • Meeting Abstracts of the Physical Society of Japan

    Meeting Abstracts of the Physical Society of Japan 65.1.4(0), 979, 2010

    The Physical Society of Japan

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