書誌事項
- タイトル別名
-
- C37 Development on on-machine surface measurement system for non-spherical micro lens mold
抄録
A novel surface measurement system has been developped in order to evaluate the process of fabricating micro lenses. White light interferometer is conventionally applied for the flat surface and sphreical surface of lens mold. However it is difficult to evaluate the non-spherical lens mold by using the white light interferometer. We propose light scattering method which applied the extended TIS model in order to evaluate a surface texture of a non-spherical microlens mold. In this report we describe the experiment result wihtch measure the surface roughness of flat Si wafer coated with Cu. The developed system can detect scattered light pattern from the surface, and the roughness is agreed with theoritical model of TIS.
収録刊行物
-
- 生産加工・工作機械部門講演会 : 生産と加工に関する学術講演会
-
生産加工・工作機械部門講演会 : 生産と加工に関する学術講演会 2008.7 (0), 277-278, 2008
一般社団法人 日本機械学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390282680875904640
-
- NII論文ID
- 110007705697
-
- ISSN
- 24243094
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可