書誌事項
- タイトル別名
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- S1303-1-1 Non-contact evaluation for aspherical microlens mold using light scattering
抄録
A novel surface measurement system has been developed in order to evaluate the process of fabricating micro lenses. White light interferometer is conventionally applied for the flat surface and spherical surface of lens mold. However it is difficult to evaluate the non-spherical lens mold by using the white light interferometer. We propose light scattering method which applied the extended TIS model in order to evaluate a surface texture of a non-spherical microlens mold. In this report we describe the experiment result which measure the surface roughness of flat Si wafer coated with Cu. The developed system can detect scattered light pattern from the surface, and the roughness is agreed with of TIS.
収録刊行物
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- 年次大会講演論文集
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年次大会講演論文集 2009.4 (0), 267-268, 2009
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390001206063796736
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- NII論文ID
- 110007861919
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- ISSN
- 24331325
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可