C-3-57 シリコンフォトニクス錮線導波路デバイスの伝搬損失と製造誤差(C3.光エレクトロニクス,一般セッション)  [in Japanese] C-3-57 Propagation Loss and Fabrication Error in Silicon-Wire Based Silicon Photonic Devices  [in Japanese]

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Author(s)

Journal

  • Proceedings of the Society Conference of IEICE

    Proceedings of the Society Conference of IEICE 2014年_エレクトロニクス(1), 154, 2014-09-09

    The Institute of Electronics, Information and Communication Engineers

Codes

  • NII Article ID (NAID)
    110009881960
  • NII NACSIS-CAT ID (NCID)
    AN10489017
  • Text Lang
    JPN
  • Data Source
    NII-ELS 
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