Crystallographic characterization of epitaxial Pb(Zr,Ti)O-3 films with different Zr/Ti ratio grown by radio-frequency-magnetron sputtering

• Kanno, I

• Kotera, H

• Wasa, K

• Matsunaga, T

• Kamada, T

• Takayama, R

収録刊行物

• JOURNAL OF APPLIED PHYSICS

  JOURNAL OF APPLIED PHYSICS 93 (7), 4091-4096, 2003-04-01

  AMER INST PHYSICS

詳細情報

• CRID: 1050564285487068032
• NII論文ID: 120000897097
• ISSN: 00218979
• HANDLE: 2433/50135
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles
  • KAKEN