Noncontact atomic force microscopy study of copper-phthalocyanines: Submolecular-scale contrasts in topography and energy dissipation

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抄録

Copper-phthalocyanine (CuPc) thin films on MoS2surfaces were investigated by noncontact atomic force microscopy (NC-AFM). Submolecular resolution was successfully obtained in both topographic and dissipation images of CuPc monolayers. For topographic contrasts, the influence of short-range chemical interactions is particularly considered while the dissipation contrasts are discussed in relation to the tip-induced molecular fluctuations. Molecularly-resolved NC-AFM image was also obtained on CuPc multilayer, which revealed the structural difference between the monolayer and multilayersurfaces. The energy dissipation measured on these surfaces showed distinctive difference reflecting the different structural stabilities in the films. Furthermore, local surface modification of CuPc monolayer was demonstrated by NC-AFM. This is a direct evidence for the existence of energy transfer from the vibrating cantilever to the molecules through dissipative tip–sample interactions.

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詳細情報 詳細情報について

  • CRID
    1050282677273421952
  • NII論文ID
    120000902295
  • ISSN
    00218979
  • HANDLE
    2433/39710
  • 本文言語コード
    en
  • 資料種別
    journal article
  • データソース種別
    • IRDB
    • CiNii Articles

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