High resonance frequency force microscope scanner using inertia balance support.

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Abstract

金沢大学 理工研究域 数物科学系We have developed the atomic force microscope scanner with the high resonance frequency of 540 kHz in the z axis using a piezosupport mechanism "inertia balance support." In the method, a cubic piezoactuator is supported at the four sides perpendicular to the extension axis, by which the resonance frequency of the scanner remains as high as that of the actuator in the free vibration. The scanner allows driving at low voltage ±15 V for the practical z scan range of 330 nm. We demonstrate the applicability of the scanner to the true-atomic-resolution imaging of mica in liquid. © 2008 American Institute of Physics.

Journal

  • American Institute of Physics

    American Institute of Physics 92(24), 243119-243121, 2008-01-01

    American Institute of Physics

Codes

  • NII Article ID (NAID)
    120001130538
  • NII NACSIS-CAT ID (NCID)
    AA00543431
  • Text Lang
    ENG
  • Article Type
    journal article
  • ISSN
    0003-6951
  • Data Source
    IR 
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