A high-resolution small-angle light scattering instrument for soft matter studies

• 金谷, 利治

• Ogawa, Hiroki

• Matsuba, Go

• Konishi, Takashi

• Kanaya, Toshiji

抄録

A small-angle light scattering (SALS) instrument with a high resolution at low angles and a high signal-to-noise ratio has been developed. Both a wide dynamic range and a wide scattering vector range are achieved using a two-dimensional array of complementary metal oxide semiconductor image sensors. These instrument characteristics have enabled us to obtain high-quality light scattering data from soft matter systems. This setup is especially well suited to studies of systems with a weak scattering power and/or a time-dependent structure evolution in a wide spatial range from submicrometre to submillimetre. An application of this instrument to a polyelectrolyte blend and an extremely thin blend film are reported.

収録刊行物

• Journal of Applied Crystallography

  Journal of Applied Crystallography 41 (4), 723-728, 2008-08

  International Union of Crystallography

キーワード

• small-angle light scattering (SALS)
• complementary metal oxide semiconductor (CMOS) image sensors
• soft matter
• instrument design

詳細情報

• CRID: 1050001201938371712
• NII論文ID: 120001851027
• NII書誌ID: AA00693423
• ISSN: 00218898
• HANDLE: 2433/93445
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles