X線マイクロアナライザー（JXA5A）の定量精度に関する2，3の検討

• 田崎 耕市

• 平野 英雄

書誌事項

タイトル別名

• Preliminary experiments of electron probe X-ray microanalyzer (JXA5A)
• Xセン マイクロアナライザー JXA5A ノ テイリョウ セイド ニ カンスル 2 , 3 ノ ケントウ

抄録

Preliminary experiments on the accuracy of quantitative microprobe analysis for the instrument set in the Institute for Themal Spring Research, Okayama University were carried out. Dead time of the instrument ranged about 5.5-5.6 microsecond, which delayed 1.5 microsecond than usual value. Bombarding by finely focused electron beam, intensities of the characteristic X-ray of alkali metal such as NaKα and KKα decreased drastically in five to ten minutes. Intensities of the characteristic X-ray decreased in relation to the degree of off-focusing, when the spectrometer fixed at optically focused position. Readjusting of spectrometer after every move of sample was indispensable for the proof of accurate intensities. Applying BENCE and ALBEE'S correction method, empirical a factors was approved of preferable for quantitative analyses of silicates than calculated α factors.

収録刊行物

• 岡山大学温泉研究所報告

  岡山大学温泉研究所報告 42 9-23, 1973-03-25

  岡山大学温泉研究所

詳細情報

• CRID: 1390009224548441088
• NII論文ID: 120002398145
• NII書誌ID: AN00032853
• ISSN: 03697142
• DOI: 10.18926/40141
• NDL書誌ID: 7506319
• Web Site: https://ousar.lib.okayama-u.ac.jp/40141
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7506319
• 本文言語コード: ja
• データソース種別:
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  • IRDB
  • NDL
  • CiNii Articles