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Abstract

A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and gamma-ray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized gamma-rays at SPring-8.

Journal

  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 622(3), 619-627, 2010-10-21

    Elsevier Science BV

Codes

  • NII Article ID (NAID)
    120002737836
  • NII NACSIS-CAT ID (NCID)
    AA10529991
  • Text Lang
    ENG
  • Article Type
    journal article
  • ISSN
    0168-9002
  • Data Source
    IR 
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