Focusing of light by negative refraction in photonic crystal slab superlens on　SOI substrate

IR

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Abstract

type:post print

We experimentally observed the focusing of light by the negative refraction in a photonic crystal slab superlens at near infrared wavelengths λ of 1.26 - 1.42 μm. The photonic crystal with optimized interfaces low reflection and diffraction losses was formed in silicon-on-insulator. The near field pattern of the focusing was observed using intentional out-of-plane radiation or scattering of guided light in the slab. The minimum focused spot affected by the aberration was 1.8 μm (1.4λ) in width. The focusing characteristics were in good agreement with theoretical ones obtained from photonic band and finite-difference time-domain analyses.

Journal

  • Optics letters

    Optics letters 31 (18), 2786-2788, 2006-09

    Optical Society of America

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