Elastic Constant and Microstructure of Oxide Thin Films Studied by Brillouin Oscillation
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- SHAGAWA Tomohiro
- 大阪大学大学院基礎工学研究科
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- OGI Hirotsugu
- Graduated School of Engineering Science, Osaka University
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- NAKAMURA Nobutomo
- 大阪大学大学院基礎工学研究科
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- HIRAO Masahiko
- 大阪大学大学院基礎工学研究科
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- ODAKA Hidefumi
- 旭硝子(株)
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- KIHARA Naoto
- 旭硝子(株)
Bibliographic Information
- Other Title
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- ブリルアン振動を用いた酸化物薄膜の弾性定数測定と組織評価
- ブリルアン シンドウ ヲ モチイタ サンカブツ ハクマク ノ ダンセイ テイスウ ソクテイ ト ソシキ ヒョウカ
- ブリルアン シンドウ オ モチイタ サンカブツ ハクマク ノ ダンセイ テイスウ ソクテイ ト ソシキ ヒョウカ
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Abstract
This paper studies the elastic constant and microstructure of amorphous SiO_2 (a-SiO_2) thin films deposited on Si substrates. a-SiO_2 thin films were prepared by the reactive sputtering with a Si target in the argon/oxygen mixture gas. We measured the Brillouin-oscillation frequency using a femtosecond pump-probe method. We determined the longitudinal-wave elastic constant from the measured frequency and the refractive index measured by the thin-film ellipsometry. The results show that the elastic constant of the a-SiO_2 thin film highly depend on the microstructure and microcracks. The micromechanics model was developed to explain the decrease of the stiffness with thin pancake-shaped microcracks, which were randomly distributed in the a-SiO_2 matrix. This study demonstrates that the Brillouin oscillation technique is an effective tool for evaluation of not only acoustic properties but also reliability of transparent materials.
Journal
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- TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A
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TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A 75 (749), 72-78, 2009
The Japan Society of Mechanical Engineers
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Details 詳細情報について
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- CRID
- 1390282679453724160
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- NII Article ID
- 110007044771
- 120004837122
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- NII Book ID
- AN0018742X
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- ISSN
- 18848338
- 03875008
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- HANDLE
- 11094/2917
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- NDL BIB ID
- 9798881
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- Text Lang
- ja
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- Data Source
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- JaLC
- IRDB
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed