Refinement of Conditions of Point-Contact Current Imaging Atomic Force Microscopy for Molecular-Scale Conduction Measurements
HANDLE
Open Access
Search this article
Journal
-
- Nanotechnology
-
Nanotechnology 18 (9), 1-5, 2007-03
Institute of Physics
- Tweet
Details 詳細情報について
-
- CRID
- 1050862643880887936
-
- NII Article ID
- 120004837545
-
- NII Book ID
- AA10863359
-
- HANDLE
- 11094/3342
-
- ISSN
- 09574484
-
- Text Lang
- en
-
- Article Type
- journal article
-
- Data Source
-
- IRDB
- CiNii Articles
- KAKEN