Refinement of Conditions of Point-Contact Current Imaging Atomic Force Microscopy for Molecular-Scale Conduction Measurements

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Journal

  • Nanotechnology

    Nanotechnology 18 (9), 1-5, 2007-03

    Institute of Physics

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Details 詳細情報について

  • CRID
    1050862643880887936
  • NII Article ID
    120004837545
  • NII Book ID
    AA10863359
  • HANDLE
    11094/3342
  • ISSN
    09574484
  • Text Lang
    en
  • Article Type
    journal article
  • Data Source
    • IRDB
    • CiNii Articles
    • KAKEN

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