Instrumentation for dual-probe scanning near-field optical microscopy

• Kaneta, Akio

• Fujimoto, Ryo

• Hashimoto, Tsuneaki

• Nishimura, Katsuhito

• Funato, Mitsuru

• Kawakami, Yoichi

抄録

To investigate local carrier motions, we developed a dual-probe scanning near-field optical microscope (SNOM) with two fiber probes where one is for photoexcitation and the other is for light collection. This instrumentation is based on two important techniques: the design of probe structures and distance control between the sample surface and the two probes. A finite-difference time-domain method numerically analyzed and optimized the design for high efficiency photoexcitation and light collection, while a dual band modulation realized distance control. Real time detection of the oscillations of the probe tips using different frequencies independently controls the distance between the probe tip and the sample surface as well as the distance between the two probes. Thus, the collection probe can be scanned around an illumination probe without destroying the probe tips. To demonstrate our SNOM, we performed photoluminescence spectroscopy under the dual-probe configuration and observed carrier motions in an InGaN quantum well.

収録刊行物

• Review of Scientific Instruments

  Review of Scientific Instruments 83 (8), 2012-08-23

  AIP Publishing

詳細情報

• CRID: 1050564285747563136
• NII論文ID: 120005439698
• NII書誌ID: AA00817730
• ISSN: 00346748
• HANDLE: 2433/187966
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles