Slow intraband relaxation and localization of photogenerated carriers in CuIn{1−x}Ga{x}Se{2} thin films: Evidence for the existence of long-lived high-energy carriers
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The dynamics of free carriers in polycrystalline CuIn{1−x}Ga{x}Se{2} (CIGS) thin films were studied using picosecond time-resolved photoluminescence (PL) and femtosecond transient-absorption (TA) measurements. The PL spectrum and the TA decay component due to the band-to-band recombination of free carriers were observed in the picosecond time region. From excitation-photon-energy-dependent TA measurements, we identified a slow intraband relaxation of free carriers in the CIGS thin films. Collectively, the combination of PL and TA experiments reveal a global feature of energy relaxation and recombination processes of free carriers in the femtosecond to nanosecond time regions.
収録刊行物
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- Physical Review B
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Physical Review B 89 (19), 2014-05-20
American Physical Society
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詳細情報 詳細情報について
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- CRID
- 1050001335796975872
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- NII論文ID
- 120005477677
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- NII書誌ID
- AA11187113
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- ISSN
- 10980121
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- HANDLE
- 2433/191007
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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- IRDB
- CiNii Articles