Advanced instrumentation of frequency modulation AFM for subnanometer-scale 2D/3D measurements at solid-liquid interfaces
抄録
金沢大学ナノ生命科学研究所
Since the first demonstration of true atomic-resolution imaging by frequency modulation atomic force microscopy (FM-AFM) in liquid, the method has been used for imaging subnanometer-scale structures of various materials including minerals, biological systems and other organic molecules. Rencetly, there have been further advancements in theFM-AFMinstrumentation. Three-dimensional (3D) force measurement techniques are proposed for visualizing 3D hydration structures formed at a solid-liquid interface. Thesemethods further enabled to visualize 3D distributions of flexible surface structures at interfaces between soft materials andwater. Furthermore, the fundamental performance such as force sensitivity and operation speed have been significantly improved using a small cantilever and high-speed phase detector. These technical advancements enabled direct visualization of atomic-scale interfacial phenomena at 1 frame/s. In this chapter, these recent advancements in the FM-AFM instrumentation and their applications to the studies on various interfacial phenomena are presented. © Springer International Publishing Switzerland 2015
収録刊行物
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- NanoScience and Technology
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NanoScience and Technology 97 435-460, 2015-01-01
Springer Verlag
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詳細情報 詳細情報について
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- CRID
- 1390295116813732224
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- NII論文ID
- 120005646688
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- ISSN
- 14344904
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- Web Site
- http://hdl.handle.net/2297/43017
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- IRDB
- CiNii Articles