Local impedance measurement of an electrode/single-pentacene-grain interface by frequency-modulation scanning impedance microscopy

• 小林, 圭

• 山田, 啓文

• Yamada, Hirofumi

抄録

The device performances of organic thin film transistors are often limited by the metal–organic interface because of the disordered molecular layers at the interface and the energy barriers against the carrier injection. It is important to study the local impedance at the interface without being affected by the interface morphology. We combined frequency modulation atomic force microscopy with scanning impedance microscopy (SIM) to sensitively measure the ac responses of the interface to an ac voltage applied across the interface and the dc potential drop at the interface. By using the frequency-modulation SIM (FM-SIM) technique, we characterized the interface impedance of a Pt electrode and a single pentacene grain as a parallel circuit of a contact resistance and a capacitance. We found that the reduction of the contact resistance was caused by the reduction of the energy level mismatch at the interface by the FM-SIM measurements, demonstrating the usefulness of the FM-SIM technique for investigation of the local interface impedance without being affected by its morphology.

収録刊行物

• Journal of Applied Physics

  Journal of Applied Physics 118 (5), 2016-09-29

  AIP Publishing

詳細情報

• CRID: 1050282810814971008
• NII論文ID: 120005844267
• ISSN: 00218979
• HANDLE: 2433/216682
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles