Inspection of bare printed circuit board using planar type ect probe

• Yamada, Sotoshi

• Iwahara, Masayoshi

• Fukuda, Y.

• Taniguchi, T.

• Wakiwaka, H.

収録刊行物

• Review of Quantitative Nondestructive Evaluation

  Review of Quantitative Nondestructive Evaluation 23 (CP700), 374-381, 2004-01-01

  AIP Publishing

詳細情報

• CRID: 1050001335939493760
• NII論文ID: 120006345319
• Web Site: http://hdl.handle.net/2297/48633
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles
  • KAKEN