High-speed XYZ-nanopositioner for scanning ion conductance microscopy

• Watanabe Shinji

• Ando Toshio

• 渡邉 信嗣

• 安藤 敏夫

抄録

金沢大学理工研究域バイオＡＦＭ先端研究センター

We describe a tip-scan-type high-speed XYZ-nanopositioner designed for scanning ion conductance microscopy (SICM), with a special care being devoted to the way of nanopipette holding. The nanopipette probe is mounted in the center of a hollow piezoactuator, both ends of which are attached to identical diaphragm flexures, for Z-positioning. This design minimizes the generation of undesirable mechanical vibrations. Mechanical amplification is used to increase the XY-travel range of the nanopositioner. The first resonance frequencies of the nanopositioner are measured as ∼100 kHz and ∼2.3 kHz for the Z- and XY-displacements, respectively. The travel ranges are ∼6 μm and ∼34 μm for Z and XY, respectively. When this nanopositioner is used for hopping mode imaging of SICM with a ∼10-nm radius tip, the vertical tip velocity can be increased to 400 nm/ms; hence, the one-pixel acquisition time can be minimized to ∼1 ms. © 2017 Author(s).

Embargo Period 12 months

収録刊行物

• Applied Physics Letters

  Applied Physics Letters 111 (11), 113106-, 2017-09-11

  American Institute of Physics Inc.

詳細情報

• CRID: 1390290699936935424
• NII論文ID: 120006370925
• NII書誌ID: AA00543431
• ISSN: 00036951
• DOI: 10.24517/00049485
• Web Site: http://hdl.handle.net/2297/00049485
• 本文言語コード: en
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