Application of pentacene thin-film transistors with controlled threshold voltages to enhancement/depletion inverters

• Takahashi, Hajime

• Hanafusa, Yuki

• Kimura, Yoshinari

• 北村, 雅季

抄録

Oxygen plasma treatment has been carried out to control the threshold voltage in organic thin-film transistors (TFTs) having a SiO2 gate dielectric prepared by rf sputtering. The threshold voltage linearly changed in the range of -3.7 to 3.1 V with the increase in plasma treatment time. Although the amount of change is smaller than that for organic TFTs having thermally grown SiO2, the tendency of the change was similar to that for thermally grown SiO2. To realize different plasma treatment times on the same substrate, a certain region on the SiO2 surface was selected using a shadow mask, and was treated with oxygen plasma. Using the process, organic TFTs with negative threshold voltages and those with positive threshold voltages were fabricated on the same substrate. As a result, enhancement/depletion inverters consisting of the organic TFTs operated at supply voltages of 5 to 15V.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 57 (3), 03EH03-03EH03, 2018-03

  The Japan Society of Applied Physics

詳細情報

• CRID: 1050856995323835520
• NII論文ID: 120006469055
• ISSN: 13474065
• ISSN: 00214922
• HANDLE: 20.500.14094/90004872
• 本文言語コード: en
• 資料種別: journal article
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