Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements

• 永谷, 清信

• Motomura, Koji

• Fukuzawa, Hironobu

• Nagaya, Kiyonobu

• Ueda, Kiyoshi

抄録

X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniques, in particular multi-ion time-of-flight (TOF) coincident experiments, can provide detailed information on the photoabsorption, charge generation, and Coulomb explosion events. Here we review several such recent experiments performed at the SPring-8 Angstrom Compact free electron LAser (SACLA) facility in Japan, with iodomethane, diiodomethane, and 5-iodouracil as targets. We demonstrate how to utilize the momentum-resolving capabilities of the ion TOF spectrometers to resolve and filter the coincidence data and extract various information essential in understanding the time evolution of the processes induced by the XFEL pulses.

収録刊行物

• Applied Sciences

  Applied Sciences 7 (5), 531-, 2017-05-19

  MDPI AG

キーワード

• free electron laser
• Coulomb explosion
• radiation damage
• molecular dynamics
• X-ray absorption
• ultrafast dissociation
• coincidence
• photoion-photoion coincidence (PIPICO)
• ion mass spectroscopy
• time-of-flight

詳細情報

• CRID: 1050564285813710592
• NII論文ID: 120006491843
• ISSN: 20763417
• DOI: 10.3390/app7050531
• HANDLE: 2433/232861
• Web Site: http://www.mdpi.com/2076-3417/7/5/531/pdf
• 本文言語コード: en
• 資料種別: journal article
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