Secondary Resonance Magnetic Force Microscopy

• 田中, 傑

• Tanaka, Suguru

• 東, 康男

• Azuma, Yasuo

• 真島, 豊

• MAJIMA, YUTAKA

抄録

In this study, we have developed secondary resonance magnetic force microscopy (SR-MFM) for imaging alternating magnetic fields from a sample surface at the secondary resonant frequency of the magnetic cantilever at the same time as the topographic image. SR-MFM images of alternating magnetic fields diverging from the main pole in a driving perpendicular magnetic recording head are presented, and the divergence and convergence of the fields are discussed. The spatial resolution of SR-MFM is estimated to be 18 nm; this is 2.5 times smaller than that of conventional MFM.

identifier:oai:t2r2.star.titech.ac.jp:50197485

収録刊行物

• J. Appl. Phys.

  J. Appl. Phys. 111 084312-, 2012-04

  American Institute of Physics

キーワード

• General Physics and Astronomy

詳細情報

• CRID: 1050564287970799488
• NII論文ID: 120006582181
• DOI: 10.1063/1.4705400
• ISSN: 10897550
• ISSN: 00218979
• Web Site: http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100648937
• Web Site: https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/1.4705400/14767011/084312_1_online.pdf
• 本文言語コード: en
• 資料種別: journal article
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