Low temperature x-ray diffraction study on superconductivity

• Xue, Y.

• Kaneko, H.

• Tao, Q.

• Xu, Z. Z.

• Takeda, N.

• Nemoto, Y.

• Goto, T.

• Suzuki, Haruhiko

Abstract

金沢大学理工研究域

Using a low temperature x-ray diffractometer, we studied superconductivity materials, optimally doped and underdoped YBCOs and PrOs4Sb 12 between 0.1 K and 300 K. At several temperatures, whole profiles of the x-ray reflection peak were measured and refined by Rietveld analysis. By Rietveld analysis, we found that Pr atoms in PrOs4Sb12 are still oscillating at an amplitude of about 0.1 A at 0.18 K. For some reflection planes, x-ray diffraction measurement with a small step size and a long stepping time was performed to accumulate more counts at certain temperatures. The lattice constant d of optimally doped YBCO (OPT YBCO) shows anomalous behaviours at around the superconductivity transition temperature Tc and around spin gap temperature T*. In OPT YBCO, the intensity of the reflection spectrum shows a clear anomaly at around Tc. © 2009 IOP Publishing Ltd.

Journal

• Journal of Physics: Conference Series

  Journal of Physics: Conference Series 150 (5), 52284-, 2009-01-01

  Institute of Physics

Details

• CRID: 1050292572105560576
• NII Article ID: 120006655915
• ISSN: 17426588
• Web Site: http://hdl.handle.net/2297/24448
• Text Lang: en
• Article Type: conference paper
• Data Source:
  • IRDB
  • CiNii Articles