Evaluation of organic metal-oxide-semiconductor capacitors based on a distributed constant circuit
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The capacitance characteristics of pentacene metal-oxide-semiconductor (MOS) capacitors with a large uncovered pentacene area have been investigated. The capacitance measured was examined by assuming that the uncovered area is represented by a distributed constant circuit. The frequency dependence of the capacitance was reproduced by an equation derived based on the assumption. The sheet resistance for the uncovered area of a MOS capacitor was calculated as a function of the gate voltage from the capacitance measured. The mobility of a MOS capacitor with an uncovered area was estimated by fitting a curve to the gate voltage dependence of the sheet resistance, and was in the range of 0.48-0.64 cm(2) V(-1) s(-1). In addition, the mobilities were compared with those calculated from the current-voltage characteristics of pentacene transistors fabricated on the same substrate.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 59 (3), 036503-036503, 2020-03-01
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1050856995322329600
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- NII論文ID
- 120006876722
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- NII書誌ID
- AA12295836
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- ISSN
- 13474065
- 00214922
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- HANDLE
- 20.500.14094/90007352
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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