Potential dependent structure of an ionic liquid at ionic liquid/water interface probed by x-ray reflectivity measurements
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- 西, 直哉
- Department of Energy and Hydrocarbon Chemistry, Graduate School of Engineering, Kyoto University
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- Uruga, Tomoya
- Japan Synchrotron Radiation Research Institute
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- Tanida, Hajime
- Japan Synchrotron Radiation Research Institute
抄録
The structure at air interface and water (W) interface of a hydrophobic ionic liquid (IL), trioctylmethylammonium tetrakis[3, 5-bis(trifluoromethyl)phenyl]borate ([TOMA+][TFPB-]), has been studied using x-ray reflectometry. Multilayering of ions has been found at the IL/air interface, with the topmost ionic layer having lower density than the IL bulk. For the IL/W interface, x-ray reflectivity data depends on the phase-boundary potential across the IL/W interface. When the phase-boundary potential of W with respect to IL, ΔIL Wφ, is + 0.20 V, TFPB- ions are accumulated at the topmost ionic layer on the IL side of the IL/W interface. On the other hand, when ΔIL Wφ = - 0.27 V, the accumulation of TOMA+ ions occurs with bilayer thickness, which is probably due to local interaction between TOMA+ ions at the topmost layer and at the second layer through interdigitation of their alkyl chains. To quantitatively analyze the x-ray reflectivity data, we construct a model of the electrical double layer (EDL) at the IL/W interface, by combining the Gouy-Chapman-Stern model on the W side and the Oldham model on the IL side. The constructed model predicts that the EDL on the IL side is within the topmost layer for the phase-boundary potentials in the present study, suggesting that the TOMA+ bilayer found at the negative potential results from the local interaction beyond the framework of the present mean-field theory. Even at the positive potential the surface charge density predicted by the EDL theory is significantly smaller than that estimated from x-ray reflectivity data, which implies that densification of the topmost ionic layer leads us to overestimate the surface charge density.
収録刊行物
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- Journal of Electroanalytical Chemistry
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Journal of Electroanalytical Chemistry 759 129-136, 2015-12-15
Elsevier BV
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キーワード
詳細情報 詳細情報について
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- CRID
- 1050567175332402432
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- NII論文ID
- 120006886564
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- ISSN
- 15726657
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- HANDLE
- 2433/254674
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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- IRDB
- CiNii Articles