Scan-Less, Kilo-Pixel, Line-Field Confocal Phase Imaging with Spectrally Encoded Dual-Comb Microscopy
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Confocal laser microscopy (CLM) is a powerful tool in life science research and industrial inspection, and its image acquisition rate is boosted by scan-less imaging techniques. However, the optical-intensity-based image contrast in CLM makes it difficult to visualize transparent non-fluorescent objects or reflective objects with nanometer unevenness. In this paper, we introduce an optical frequency comb (OFC) to scan-less CLM to give the optical-phase-based image contrast. One-dimensional (1D) image pixels of a sample are separately encoded onto OFC modes via 1D spectral encoding by using OFC as an optical carrier of amplitude and phase with a vast number of discrete frequency channels. Then, line-field confocal information of amplitude and phase are decoded from a mode-resolved OFC amplitude and phase spectra obtained by dual-comb spectroscopy. The proposed confocal phase imaging will further expand the application fields of CLM.
収録刊行物
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- IEEE Journal of Selected Topics in Quantum Electronics
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IEEE Journal of Selected Topics in Quantum Electronics 25 (1), 6801408-, 2018-11-09
IEEE
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詳細情報 詳細情報について
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- CRID
- 1050567903550163200
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- NII論文ID
- 120006937692
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- NII書誌ID
- AA11036333
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- ISSN
- 1077260X
- 15584542
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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- IRDB
- CiNii Articles