Development of spin-contrast-variation neutron reflectometry for the structural analysis of multilayer films

• Kumada, Takayuki

• Akutsu, Kazuhiro

• Oishi, Kazuki

• Morikawa, Toshiaki

• Kawamura, Yukihiko

• Sahara, Masae

• Suzuki, Junichi

• Torikai, Naoya

Bibliographic Information

Other Title

• スピンコントラスト変調中性子反射率測定法による複数の表面界面構造の決定

Abstract

We developed a technique of spin-contrast-variation neutron reflectometry (SCV-NR). Polarized-neutron reflectivity curves of film samples vary as a function of their proton-polarization P. The P-dependent reflectivity curves of a polystyrene film was precisely reproduced using a common set of structure parameters and the P-dependent neutron scattering length. The reflectivity curve of poly (styrene-block-isoprene) (PSPI) presented a shoulder attributed to holes with the depth corresponding to one period of periodic lamellae on the free surface only at a specific P. In this way, structural information about specific surfaces or interfaces can be obtained by controlling the P.

Journal

• Journal of Applied Crystallography

  Journal of Applied Crystallography 52 (5), 1054-1060, 2019-10

  International Union of Crystallography (IUCr)

Keywords

• General Biochemistry, Genetics and Molecular Biology

Details

• CRID: 1050568617196333184
• NII Article ID: 120006956355
• DOI: 10.1107/s1600576719010616
• ISSN: 16005767
• ISSN: 00218898
• Web Site: https://jopss.jaea.go.jp/search/servlet/search?5062630
• Web Site: http://journals.iucr.org/j/issues/2019/05/00/fs5178/fs5178.pdf
• Text Lang: en
• Article Type: journal article
• Data Source:
  • IRDB
  • Crossref
  • CiNii Articles
  • KAKEN