High refractive index properties of oxyfluorosilicate glasses and a unified dielectric model of silicate oxide glasses in sub-Terahertz frequency region
書誌事項
- タイトル別名
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- High refractive index properties of oxyfluorosilicate glasses and a unified dielectric model of silicate oxide glasses in the sub-terahertz frequency region
抄録
Dielectric properties of oxyfluorosilicate (OFS) glasses have been characterized using Terahertz (THz)-time domain spectroscopy in the sub-THz region as well as optical reflection measurement. OFS glass containing 20 mol% of Nb2O5, which is termed ZNbKLSNd glass, has the highest refractive index of 3.70 in the sub-THz region. The THz and optical refractive indices of various silicate oxide glasses, including OFS glasses, have been confirmed to be correlated by a unified relationship utilizing a parameter defined by the ratio of ionic to electronic polarizability. Additionally, the frequency dependence of the THz dielectric constant has been interpreted by a single oscillator model for all silicate oxide glasses including OFS glasses. On the basis of the present unified dielectric model, the very high refractive index of ZNbKLSNd glass has been attributed to the lowering of oscillator resonance wavelength originated from the incorporation of Nb2O5 intermediate network former.
収録刊行物
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- Optical Materials Express
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Optical Materials Express 10 (2), 607-621, 2020-01-28
OSA publishing
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詳細情報 詳細情報について
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- CRID
- 1050294045368465664
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- NII論文ID
- 120007017140
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- ISSN
- 21593930
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- HANDLE
- 20.500.14094/90008125
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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