Electron temperature profile collapse induced by double-odd-parity MHD mode in the Large Helical Device

• Kobayashi, Tatsuya

• IDA, Katsumi

• SUZUKI, Yasuhiro

• TAKAHASHI, Hiromi

• TAKEMURA, Yuki

• YOSHINUMA, Mikiro

• TSUCHIYA, Hayato

• Sanders, M.

• LHD, Experiment Group

抄録

0000-0001-5669-1937

0000-0003-3754-897X

0000-0001-7618-6305

0000-0002-0585-4561

In this paper, we report new results of a beam switching experiment aiming at a reversed magnetic shear profile formation for the study of an MHD-mode-induced profile collapse event. A transient MHD mode, whose oscillation frequency chirps down, is observed. The electron temperature profile collapse is induced by the mode activity, leading to the flattening of the central electron temperature profile. The radial mode structure is the double-oddparity at the beginning, but it transits to the even-parity in its final stage. The central electron temperature profile recovers after the radial mode structure changes to the even-parity, even though the mode itself does not disappear.

収録刊行物

• Nuclear Fusion

  Nuclear Fusion 60 (3), 036017-, 2020-02-18

  IOP Publishing

キーワード

• MHD instability
• electron temperture profile collapse
• double-odd-parity

詳細情報

• CRID: 1050288757484575616
• NII論文ID: 120007116688
• DOI: 10.1088/1741-4326/ab6b40
• ISSN: 17414326
• ISSN: 00295515
• HANDLE: 10655/00012585
• Web Site: https://nifs-repository.repo.nii.ac.jp/records/10603
• Web Site: https://iopscience.iop.org/article/10.1088/1741-4326/ab6b40
• Web Site: https://iopscience.iop.org/article/10.1088/1741-4326/ab6b40/pdf
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
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