Experimental Demonstration of the Breit Interaction which Dominates the Angular Distribution of X-ray Emission in Dielectronic Recombination

• Hu, Zhimin

• Han, Xiaoying

• Kato, Daiji

• 仝, 暁民

• Nakamura, Nobuyuki

収録刊行物

• Physical review letters

  Physical review letters 108 (07), 073002-, 2012-02

  American Physical Society

詳細情報

• CRID: 1050001202639049472
• NII論文ID: 120007130729
• NII書誌ID: AA00773679
• HANDLE: 2241/116678
• ISSN: 00319007
• Web Site: https://tsukuba.repo.nii.ac.jp/records/26933
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles