Interactive Strength between C60 Thin Film and Si(001) and Its Influence on Nano-Scaled Tribology
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The influences of interactions between C<sub>60</sub> thin films and Si substrates were investigated using atomic force microscopy (AFM). It was found that higher friction coefficient was obtained at the C<sub>60</sub> domains formed on the H-terminated Si(001) substrate and lower ones on the Si(001)-2×1 substrate. Moreover, lowest friction coefficient was found for the C<sub>60</sub> film on the Si(001)-2×1 remained after scratching. Therefore, it is thought that higher interactions between C<sub>60</sub> and Si substrate caused lower friction coefficient of C<sub>60</sub> thin film. The prepared substrate was examined by reflection high energy electron diffraction (RHEED), X-ray photoelectron spectroscopy (XPS), and Auger electron spectroscopy (AES).
- Tribology Online
Tribology Online 3(4), 232-237, 2008
Japanese Society of Tribologists