Crystal Morphology Analysis of Piezoelectric Ceramics Using Electron BackScatter Diffraction Method and Its Application to Multiscale Finite Element Analysis
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- UETSUJI Yasutomo
- Department of Mechanical Engineering, Osaka Institute of Technology
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- SATOU Yu
- Department of Mechanical Engineering, Osaka Institute of Technology
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- NAGAKURA Hideyuki
- Graduate School of Engineering, Osaka Institute of Technology
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- NISHIOKA Hisanao
- Graduate School of Engineering, Osaka Institute of Technology
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- KURAMAE Hiroyuki
- Department of Technology Management, Osaka Institute of Technology
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- TSUCHIYA Kazuyoshi
- Department of Precision Engineering, Tokai University
Abstract
Microstructural crystal morphology, which affects strongly on macroscopic electromechanical behaviors of polycrystalline piezoelectric ceramics, was analyzed using electron backscatter diffraction method. We coated piezoelectric ceramics with amorphous osmium to defend against electrification caused by electron beam, and measured crystal orientations of 140×120 μm2 over region at 0.32 μm scanning interval. Then the obtained crystal orientations were applied to a multiscale finite element analysis to evaluate the relation with macroscopic mechanical and electrical properties. Especially, we investigated on finite element modeling conditions to sample crystal orientations, and presented a representative volume element of microstructure to compute the macroscopic homogenized properties and the microscopic localized responses.
Journal
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- Journal of Computational Science and Technology
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Journal of Computational Science and Technology 2 (4), 568-577, 2008
The Japan Society of Mechanical Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1390282680250782720
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- NII Article ID
- 130000079195
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- ISSN
- 18816894
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- Text Lang
- en
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed