High-speed high-reflectance-resolution reflectometry by synthesis of optical coherence function

• He Zuyuan

  Department of Electronic Engineering, University of Tokyo

• Tomizawa Toshihiko

  Department of Electronic Engineering, University of Tokyo

• Hotate Kazuo

  Department of Electronic Engineering, University of Tokyo

Abstract

A novel high-speed optical reflectometry with high-reflectance-resolution is demonstrated by synthesis of optical coherence function for diagnosis of optical fiber assembly modules. In this new scheme, the optical frequency of a laser source is modulated doubly: one in sinusoidal wave to synthesize a coherence peak scanning along the fiber under test for distributed reflection/scattering measurement, the other in linear sweep to make the wavelength domain averaging optically for high reflectance resolution. Experimental results show that a reflection-distribution profile with reflectance-resolution better than 0.1dB can be obtained within 1 minute with this method.

Journal

• IEICE Electronics Express

  IEICE Electronics Express 3 (7), 122-128, 2006

  The Institute of Electronics, Information and Communication Engineers

Keywords

• fiber characterization
• troubleshooting
• optical reflectometry
• optical coherence
• Rayleigh scattering

Details

• CRID: 1390282680189405184
• NII Article ID: 130000088379
• DOI: 10.1587/elex.3.122
• ISSN: 13492543
• Web Site: http://www.jstage.jst.go.jp/article/elex/3/7/3_7_122/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed