ESD Ground Testing of Triple-Junction Space Solar Cells with Monolithic Diodes

• NOZAKI Yukishige

  NEC Toshiba Space Systems, Ltd.

• MASUI Hirokazu

  Department of Electrical Engineering, Kyushu Institute of Technology

• TOYODA Kazuhiro

  Department of Electrical Engineering, Kyushu Institute of Technology

• CHO Mengu

  Department of Electrical Engineering, Kyushu Institute of Technology

• WATABE Hirokazu

  NEC Toshiba Space Systems, Ltd.

抄録

High-efficiency triple-junction (TJ) solar cells with monolithic diodes (MD) are being used for recent spacecraft solar arrays. Because the cell-to-cell inter-connector is usually connected on the MD pad, studying the effects of electrostatic discharge (ESD) on MD is necessary. Laboratory testing of two types of MD functions revealed that the weaker design was damaged by an energy discharge of 0.8J. With an external circuit simulating flight solar array, however, discharge as large as 9.3J didn't destroy the solar cell. Based on the test results, it was concluded that MD solar cells have sufficient resistance against ESD in orbit.

収録刊行物

• TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, SPACE TECHNOLOGY JAPAN

  TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, SPACE TECHNOLOGY JAPAN 7 11-17, 2009

  一般社団法人 日本航空宇宙学会

キーワード

• Solar Array
• Space Charging
• Solar Cell

詳細情報

• CRID: 1390282680188988928
• NII論文ID: 130000151792
• DOI: 10.2322/tstj.7.11
• ISSN: 13473840
• HANDLE: 10228/6017
• Web Site: https://kyutech.repo.nii.ac.jp/records/4797
• Web Site: https://www.jstage.jst.go.jp/article/tstj/7/0/7_0_11/_pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • IRDB
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可