A power-variation model for sensor node and the impact against life time of wireless sensor networks

• Matsuda Takashi

  Department of Computer and Systems Engineering, Kobe University

• Takeuchi Takashi

  Department of Computer and Systems Engineering, Kobe University

• Aonishi Takefumi

  Department of Computer and Systems Engineering, Kobe University

• Ichien Masumi

  Department of Computer and Systems Engineering, Kobe University

• Kawaguchi Hiroshi

  Department of Computer and Systems Engineering, Kobe University

• Ohta Chikara

  Department of Computer and Systems Engineering, Kobe University

• Yoshimoto Masahiko

  Department of Computer and Systems Engineering, Kobe University

Abstract

Network protocols for wireless sensor networks should be evaluated in terms of life time in a whole system. There exists power variation node due to the manufacturing variation. In this paper, we develop a power model, in which we consider threshold-voltage variation. We implement it to QualNet in order to evaluate the impact against a life time. The simulation results show that the conventional model has overestimated the life time longer than our model when nodes are randomly deployed. In addition, the network life time is extended by 19.3% compared with the conventional model by an optimum deployment.

Journal

• IEICE Electronics Express

  IEICE Electronics Express 7 (3), 197-202, 2010

  The Institute of Electronics, Information and Communication Engineers

Keywords

• wireless sensor networks
• analytical modeling

Details

• CRID: 1390001205213644032
• NII Article ID: 130000161744
• DOI: 10.1587/elex.7.197
• ISSN: 13492543
• HANDLE: 20.500.14094/90002962
• Web Site: http://www.jstage.jst.go.jp/article/elex/7/3/7_3_197/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • IRDB
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed