Angle resolved total reflection fluorescence XAFS and its application to Au clusters on TiO2(110) (1 * 1)

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Author(s)

Abstract

The bonding features and three dimensional structures of metal clusters on single crystal oxide surfaces can be determined by the polarization dependent total reflection fluorescence XAFS (PTRF-XAFS) method. K-edge XAFS has a cos<sup>2</sup> θ polarization-dependence to give successfully three dimensional structure while L<sub>3</sub> edge XAFS has a weaker polarization dependence though the L<sub>3</sub> edge is suitable for Au and Pt samples. In order to overcome this issue, we have developed an angle-resolved total reflection fluorescence XAFS (ARTRF-XAFS) method to determine more precise three dimensional structures of Au clusters using the L<sub>3</sub> edge by increase the number of data points. In this paper we described the methodologies of the ARTRF-XAFS and the results of Au clusters on the TiO<sub>2</sub>(110) surface.

Journal

  • Journal of the Ceramic Society of Japan

    Journal of the Ceramic Society of Japan 119(1395), 890-893, 2011

    The Ceramic Society of Japan

Codes

  • NII Article ID (NAID)
    130001310520
  • NII NACSIS-CAT ID (NCID)
    AA12229489
  • Text Lang
    ENG
  • Article Type
    特集
  • ISSN
    1882-0743
  • NDL Article ID
    11291228
  • NDL Source Classification
    ZP9(科学技術--化学・化学工業--無機化学・無機化学工業--セラミックス・窯業)
  • NDL Call No.
    Z78-A504
  • Data Source
    NDL  J-STAGE 
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