Three-Dimensional Profile Measuring System with AFM Probe
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- AYADA Sho
- Tokyo Institute of Technology
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- SAWANO Hiroshi
- 東京工業大学精密工学研究所
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- YOSHIOKA Hayato
- 東京工業大学精密工学研究所
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- SHINNO Hidenori
- 東京工業大学精密工学研究所
Bibliographic Information
- Other Title
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- AFMプローブを用いた三次元形状計測システム
Abstract
Demands for measuring three-dimensional (3D) micro-geometries over a large scanning range have recently increased in a various industries such as aerospace, dies and molds, energy, etc. This paper presents a newly developed 3D profile measuring system with both a large scanning range (18mm×18mm×10mm) and a nanometer resolution. The profile measuring system developed is consisted of an AFM probing system and a newly developed 3D nano-motion system with a large travel range. Elimination of motion errors in the nano-motion system enables the AFM probe to scan a specimen with a nanometer resolution. The measurement results of an optical lens confirmed that the developed system achieves high measurement accuracy over a large scanning range.
Journal
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- TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C
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TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C 77 (782), 3597-3607, 2011
The Japan Society of Mechanical Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1390282681363329408
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- NII Article ID
- 130001433445
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- ISSN
- 18848354
- 03875024
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed