Performance of Convenient Film Scanner System for Automatic Counting of Track Etched Pits on PADC Detectors

• Maki Daisuke

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University Oarai Research Center, Chiyoda Technol Corporation

• Sato Fuminobu

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University

• Murata Isao

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University

• Kato Yushi

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University

• Yamamoto Takayoshi

  Oarai Research Center, Chiyoda Technol Corporation

• Iida Toshiyuki

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University

抄録

  A commercially available film scanner and image processing software “ImageJ” were satisfactorily used for automatic counting of track etched pits on a PADC detector irradiated with α-rays. The performance of the α-ray counting system with the film scanner was examined by the use of a goniometric α-ray irradiation equipment. Under the etching condition of the soakage in 6.25M NaOH solution at 70°C for 20 hours, the α-ray detection efficiency of the film scanner system was about 0.6 time as small as that of the general system with an optical microscope. It was confirmed that PADC detectors together with the film scanner system could be conveniently used for radon monitoring in atmosphere.<br>

収録刊行物

• Ｒａｄｉａｔｉｏｎ　Ｓａｆｅｔｙ　Ｍａｎａｇｅｍｅｎｔ

  Ｒａｄｉａｔｉｏｎ　Ｓａｆｅｔｙ　Ｍａｎａｇｅｍｅｎｔ 9 (1), 1-6, 2010

  日本放射線安全管理学会

キーワード

• PADC detector
• track etched pit
• film scanner observation system
• ImageJ
• automatic counting
• radon monitoring

詳細情報

• CRID: 1390282680201459072
• NII論文ID: 130001474052
• DOI: 10.12950/rsm.9.1
• ISSN: 18849520
• ISSN: 13471511
• 本文言語コード: en
• データソース種別:
  • JaLC
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可