疲労転位組織形成の臨界膜厚に関する離散転位動力学解析

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  • Critical Thickness for Formation of Fatigue Dislocation Structures: A Discrete Dislocation Dynamics Study

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Formation of fatigue dislocation structure in copper thin films under cyclic loading was studied by the discrete dislocation dynamics (DDD) simulations, in which the motion of dislocation was restricted by the interfaces. The present DDD simulations successfully reproduced planar-arrayed dislocation walls in a persistent slip band (PSB) experimentally observed in copper bulk. In copper thin films with a several-micrometer thickness, the dislocation walls were stably formed by the cyclic loading, whereas they were unstable and could not be formed in the films thinner than 1 μm. This result indicates that there exists the critical thickness in the formation of fatigue dislocation structure.

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