書誌事項
- タイトル別名
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- Critical Thickness for Formation of Fatigue Dislocation Structures: A Discrete Dislocation Dynamics Study
抄録
Formation of fatigue dislocation structure in copper thin films under cyclic loading was studied by the discrete dislocation dynamics (DDD) simulations, in which the motion of dislocation was restricted by the interfaces. The present DDD simulations successfully reproduced planar-arrayed dislocation walls in a persistent slip band (PSB) experimentally observed in copper bulk. In copper thin films with a several-micrometer thickness, the dislocation walls were stably formed by the cyclic loading, whereas they were unstable and could not be formed in the films thinner than 1 μm. This result indicates that there exists the critical thickness in the formation of fatigue dislocation structure.
収録刊行物
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- 日本機械学会論文集A編
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日本機械学会論文集A編 78 (793), 1242-1249, 2012
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390282679454215808
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- NII論文ID
- 130002050350
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- ISSN
- 18848338
- 03875008
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
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- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可