Evaluation of Edge Electron Temperature Fluctuation by the Use of Fast Voltage Scanning Method on TST-2

• NAGASHIMA Yoshihiko

  The University of Tokyo, Chiba 277-8561, Japan

• EJIRI Akira

  The University of Tokyo, Chiba 277-8561, Japan

• TAKASE Yuichi

  The University of Tokyo, Chiba 277-8561, Japan

• SONEHARA Masateru

  The University of Tokyo, Chiba 277-8561, Japan

• KAKUDA Hidetoshi

  The University of Tokyo, Chiba 277-8561, Japan

• OOSAKO Takuya

  CEA, Saint Paul Lez Durance 13108, France

• HIRATSUKA Junichi

  The University of Tokyo, Chiba 277-8561, Japan

• WATANABE Osamu

  The University of Tokyo, Chiba 277-8561, Japan

• YAMAGUCHI Takashi

  The University of Tokyo, Chiba 277-8561, Japan

• KOBAYASHI Hiroaki

  The University of Tokyo, Chiba 277-8561, Japan

• WAKATSUKI Takuma

  The University of Tokyo, Chiba 277-8561, Japan

• SAKAMOTO Takuya

  The University of Tokyo, Chiba 277-8561, Japan

• HANASHIMA Kentaro

  The University of Tokyo, Chiba 277-8561, Japan

• AMBO Takanori

  The University of Tokyo, Chiba 277-8561, Japan

• SHINO Ryota

  The University of Tokyo, Chiba 277-8561, Japan

• INAGAKI Shigeru

  Kyushu University, Kasuga 816-8580, Japan

抄録

Edge electron temperature fluctuation is evaluated by the use of fast voltage sweeping technique on TST-2. The validity of obtained current-voltage characteristic curve was checked by comparing the time evolutions of floating potential between that obtained from the fast voltage sweeping technique and that measured with floating probe method. Good agreement between them was confirmed. We also found that fitting errors in the evaluation of the electron temperature itself are less than 10% of fluctuation levels of the electron temperature. Therefore the accuracy of the technique is applicable to study of plasma fluctuations.

収録刊行物

• Plasma and Fusion Research

  Plasma and Fusion Research 6 2402036-2402036, 2011

  一般社団法人 プラズマ・核融合学会

キーワード

• plasma turbulence
• temperature fluctuation
• edge plasma

詳細情報

• CRID: 1390001205253354368
• NII論文ID: 130002059528
• DOI: 10.1585/pfr.6.2402036
• ISSN: 18806821
• Web Site: http://www.jstage.jst.go.jp/article/pfr/6/0/6_0_2402036/_pdf
• 本文言語コード: en
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