A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution

• YAMAZAKI Hiroshi

  Graduate School of Industrial Technology, Nihon University

• WAKAZONO Motohiro

  Graduate School of Industrial Technology, Nihon University

• HOSOKAWA Toshinori

  College of Industrial Technology, Nihon University

• YOSHIMURA Masayoshi

  Department of Computer Science and Communication Engineering, Kyushu University

抄録

In recent years, the growing density and complexity of VLSIs have led to an increase in the numbers of test patterns and fault models. Test patterns used in VLSI testing are required to provide high quality and low cost. Don't care (X) identification techniques and X-filling techniques are methods to satisfy these requirements. However, conventional X-identification techniques are less effective for application-specific fields such as test compaction because the X-bits concentrate on particular primary inputs and pseudo primary inputs. In this paper, we propose a don't care identification method for test compaction. The experimental results for ITC'99 and ISCAS'89 benchmark circuits show that a given test set can be efficiently compacted by the proposed method.

収録刊行物

• IEICE Transactions on Information and Systems

  IEICE Transactions on Information and Systems E96.D (9), 1994-2002, 2013

  一般社団法人 電子情報通信学会

キーワード

• X-bit
• don't care identification
• X-bit distribution
• test compaction

詳細情報

• CRID: 1390001204378381184
• NII論文ID: 130003370988
• DOI: 10.1587/transinf.e96.d.1994
• ISSN: 17451361
• ISSN: 09168532
• Web Site: https://www.jstage.jst.go.jp/article/transinf/E96.D/9/E96.D_1994/_pdf
• 本文言語コード: en
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